Christopher "Kit" Umbach
Assistant Professor, Dept. of Materials Science and Engineering, Cornell
Current Group Members:
Totka Ouzounova, Ph.D. student
Jong Choi, Masters of Engineering student
ENGRI 111, Introduction to Nanotechnology (course lead: Prof. E. Giannelis)
MSE 307/407 Materials Design Concepts I and II
Manager of the CCMR Molecular and Cellular Surface Imaging (MOCSI) Facility (SB60A Bard Hall)
Manager of the NBTC Scanned Probe Microscopes in 220 Duffield Hall (Dimension 3100 and PicoPlus)
Education
| Ph.D. in applied physics, minors in physics and materials science, Cornell University | completed 9/91 |
| M.S., applied physics | 8/83-8/85 |
| Visiting student, University of Stuttgart, Federal Republic of Germany | 10/82-7/83 |
| B.A., summa cum laude, physics and philosophy, Yale University | 8/77-12/81 |
| Visiting Undergraduate Student, Harvard University | 1/79-6/79 |
Patents
"Fabrication of Atomic Step-Free Surfaces" (#5,910,339) with J.M. Blakely, S. Tanaka, R.M. Tromp
Affiliations
Materials Research Society, American Ceramic Society
“Enzyme-catalysed assembly of DNA hydrogel,” S.H. Um, J.B. Lee, N. Park, S.Y. Kwon, C.C. Umbach, D. Luo, Nature Materials 5, p. 797 (2006)
“Radiation-induced surface conductivity in an alkaline-earth boroaluminosilicate
glass measured with elevated-temperature scanning probe microscopy,”
M.J. Polking and C.C. Umbach, Journal of the American Ceramic Society 88,
p. 2442 (2005)
“Nanoscale morphologies resulting from surface treatments of display
glass in vacuum,” C. C. Umbach and Jack M. Blakely, Journal of Non-Crystalline
Solids 349, p. 267 (2004)
"Nanoscale pattern transfer using sputter-induced corrugations formed
at the Si/SiO2 interface," C. G. Allen, M. Daniels, C. C. Umbach, J.
M. Blakely in “Nanopatterning--From Ultralarge-Scale Integration to
Biotechnology” ed. by L. Merhari et al., MRS Sym. Proc. Ser. 705 p.
119 (2002)
"Spontaneous nanoscale corrugation of ion-eroded SiO2 : the role of ion
irradiation-enhanced viscous flow," C. C. Umbach, R. L. Headrick, and
K.-C. Chang, Phy. Rev. Lett. 87, p. 246104 (2001)
"A sub-picoampere scanning tunneling microscope for oxide surfaces,”
C.C. Umbach and J.M.Blakely, Applied Surface Science 175-176, p. 746 (2001)
“Topography and lattice strain development on patterned Si surfaces”,
J.M. Blakely and C.C. Umbach, Micron 30, p. 3, (1999)
"Atomic steps in the decay of 1- and 2-dimensional gratings”, J.M.
Blakely, C.C. Umbach, and S. Tanaka, in Dynamics of Crystal Surfaces and Interfaces,
ed. by P.M. Duxbury and T.J. Pence (Plenum, New York 1997)
"Specular and diffuse scattering of x-rays from a fusion-drawn glass
surface," C.C. Umbach and J.M. Blakely, Nuclear Instruments and Methods
in Physics Research 133, p. 50 (1997)
"Chemical treatment of LCD glass substrates," J.G. Couillard, D.G.
Ast, C.C. Umbach, J.M. Blakley, C.B. Moore, F.P. Fehlner, Journal of Non-Crystalline
Solids 222, p. 429 (1997)
"Step permeability and the relaxation of biperiodic gratings on Si(001)"
So Tanaka, N.C. Bartelt, C.C. Umbach, R.M. Tromp and J.M. Blakely, Phys. Rev.
Lett. 78, p. 3342 (1997)
"Annealing instabilities in small fabricated structures," S. Tanaka,
C.C. Umbach, and J.M. Blakely, Surf. Sci. 372, p. L298-L300 (1997)
"Fabrication of arrays of large step-free regions on Si(001)," S.
Tanaka, C.C. Umbach, J.M. Blakely, M. Mankos, and R.M. Tromp, Applied Physics
Letters 69 p. 1235 (1996)
"Characterization of large-area arrays of nanoscale Si tips fabricated
using thermal oxidation and wet etching of Si pillars," C.C. Umbach,
Q. Shen, B. Weselak,J.M. Blakely, J. Vac. Sci. Tech. B 14, (1996)
"Fabrication of bi-periodic sinusoidal structures on Si," S. Tanaka,
C.C. Umbach, and J.M. Blakely, Applied Physics Letters 68, p. 1966 (1996)
"Atomic diffusion and strain measurements on Si grating structures by
x-ray diffraction," S. Tanaka, C.C. Umbach, Q. Shen, and J.M. Blakely,
MRS Symp. Proc. Ser. 380 p. 61 (1995)
"Epitaxy of germanium on Si(001) grating templates,” C.C. Umbach
and J.M. Blakely, MRS Sym. Proc. Ser. 317, p. 3 (1993)
"Pairing of curved atomic steps at the extrema of periodic gratings on
Si(001)," C.C. Umbach, M.E. Keeffe, and J.M. Blakely, J. Vac. Sci. Tech.
A 10, p. 1000 (1993)
"Scanning tunneling microscope studies of one-dimensional periodic corrugated
silicon surfaces," C.C. Umbach, M.E. Keeffe, and J.M. Blakely, J. Vac.
Sci. Tech. A 9, p. 1014 (1991)
"Scanning tunneling microscope studies of phase separation on Si(001)
surfaces with periodic step density," C.C. Umbach, M.E. Keeffe, and J.M.
Blakely, J. Vac. Sci. Tech. B 9, p. 721 (1991)
"Surface self-diffusion, capillarity and surface steps," J.M. Blakely
and C. Umbach, in Diffusion at Interfaces: Microscopic Concepts, ed. M. Grunze,
H.J. Kreuzer, J.J. Weimer (Springer, Berlin 1988)
"Ellipsometric studies of electronic interband transitions in CdxHg1-xTe,"
L. Vina, C. Umbach, M. Cardona,L. Vodopyanov, Phys. Rev. B, vol. 29, no. 12,
p.6752-60 (1984)
"The absorption edge of ultraheavily doped Si," L. Vina, C. Umbach,
M. Cardona, A. Compaan, A. Axmann, Solid State Commun., vol. 48, no. 5, p.
457-9 (1983)