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People
in the Baker Research Group
Graduate
Students | Undergraduate
Students | Visiting Scientists and Postdoctorial Researchers
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Shefford P. Baker received MS (1988)
and PhD (1993) degrees in Materials Science and Engineering from Stanford University. From 1993 through
1997, he was a member of the scientific staff at the Max-Planck-Institut für Metallforschung in Stuttgart, Germany.
Baker joined the faculty in the Department of Materials Science and
Engineering at Cornell in 1997. He is also a member of the Field of
Theoretical and Applied Mechanics at Cornell.
Email: shefford.baker@cornell.edu
Tel: 607-255-6679
Fax: 607-255-2365
Cornell University
Department of Materials Science and Engineering
Bard Hall
Ithaca, NY
14853
USA
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Graduate Students
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Ray Fertig
is working on understanding the mechanical
behavior of thin films using computer simulations of dislocation
dynamics. He is currently simulating thin film loading-unloading
behavior to examine the dislocation mechanisms responsible for strain
hardening. These mechanisms allow the film to support much higher
stresses than the corresponding bulk material and they give rise to a
strong Bauschinger effect. He is also working on developing new techniques
for orientation gradient analysis of thin films from EBSD data. Ray is
from Cheyenne, Wyoming
and has a B.S. in Mechanical Engineering and Math and an M.S. in
Mechanical Engineering from the University
of Wyoming, and an M.S. in
Materials Science from Cornell
University. He
joined the group in Fall 2003 and is working towards a PhD.
Tel: 607-255-6677
Email: rsf28@cornell.edu
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Aaron Vodnick
is researching the thermomechanical
behavior of thin metal films on non-metallic substrates.
Specifically, his interests are in elucidating relationships between
elastic anisotropy, interface chemistry, microstructure, and film
stresses. Films
with precise chemistries are prepared in UHV and their
stress-temperature behaviors are characterized using substrate-curvature
and x-ray diffraction techniques performed at the Cornell High Energy Synchrotron
Source. Sub-critical adhesion measurements are used to
examine interface strengths. Aaron is from Cloquet, MN
and received a B.S. in Materials Science and Engineering from the University of Minnesota. He joined the group in
2004 and is working toward a Ph.D.
Tel:
607-255-6677
Email: amv35@cornell.edu
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Michael Lawrence
Tel: 607-255-6677
Email: mdl45@cornell.edu
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Undergraduate
Students
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Visiting
Scientists and Postdoctorial Researchers
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